The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 1999

Filed:

Dec. 31, 1997
Applicant:
Inventors:

Lay Chee, Sunnyvale, CA (US);

Abdalla Naem, Sunnyvale, CA (US);

Assignee:

National Semicoinductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438305 ; 438303 ; 438592 ; 438685 ; 438686 ;
Abstract

A process for forming metal salicide layers on an MOS transistor structure that reduces the risk of forming metal silicide bridges between source/drain regions and a polysilicon gate. The process includes the use of a uni-directional ion metal plasma deposition step to deposit a metal layer on the surface of a MOS transistor structure such that the ratio of the metal layer thickness on the surface of a gate sidewall spacers to the metal layer thickness on the surface of a polysilicon gate is no greater than 0.2. The relatively thin metal layer on the surface of the gate sidewall spacer reduces the possibility of forming metal silicide defects.


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Chee, Lay. (1999). Metal salicide process employing ion metal plasma deposition (U.S. Patent No. 5966607). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5966607

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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