The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 1999

Filed:

Jun. 24, 1997
Applicant:
Inventors:

Noriaki Yukawa, Nara-ken, JP;

Shoichi Ishii, Ibaraki, JP;

Hideshi Ueda, Yao, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382141 ; 382149 ; 345904 ; 348 92 ;
Abstract

A display screen inspection method according to the present invention takes a display screen of a display device as an inspection subject and makes decisions on defects of the display screen. The method includes performing a separation between display operating portions and display non-operating portions of the inspection subject present in a gray image from image data of individual pixels of the gray image obtained by picking up an image of the inspection subject, selectively extracting image data of only proper display operating portions and compressing the image data to be inspected for defects, and inspecting the selectively extracted image data for any defects.


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