The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1999
Filed:
Nov. 05, 1997
Johannes Marra, Eindhoven, NL;
Wilhelmus J Welters, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus (1) is provided with an X-ray source (2) and an X-ray detector (5) wherebetween there is arranged an X-ray filter (6) which includes filter elements (7) whose X-ray absorptivity can be adjusted by controlling the quantity of X-ray absorbing liquid (31) in individual filter elements (7). The filter elements (7) are formed by spaces between electrically conductive tracks (9) provided on parallel plates (8). The parallel plates are arranged in a reservoir (31) for the X-ray absorbing liquid. The liquid level in the vicinity of an electrically conductive track is controlled on the basis of an electric voltage applied to the relevant electrically conductive track (9).