The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 1999

Filed:

Mar. 28, 1997
Applicant:
Inventors:

David P O'Bryan, Kennett Square, PA (US);

Kevin N Constable, Claymont, DE (US);

Peter Sagona, Collegeville, PA (US);

Bingham H Van Dyke, Jr, Gilbertsville, PA (US);

Assignee:

SmithKline Beecham Corporation, Philadelphia, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
36447813 ; 198617 ; 422 65 ;
Abstract

This invention relates to an automated apparatus for subjecting samples to one or more selected test procedures at one or more test stations comprising a conveyor line for transporting samples contained in uniquely labeled containers, said line having at least two lanes for routing said containers to one or more selectable test stations, at least one of said lanes being a transport lane and at least one of said lanes being a queue line, and having a container interface device for transferring containers to said testing device from the queue lane and back again onto said queue lane.


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