The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1999
Filed:
Aug. 07, 1998
Craig Palmer Bush, Lexington, KY (US);
Philip Jerome Heink, Lexington, KY (US);
David Kurt Klaffenbach, Versailles, KY (US);
Thomas Campbell Wade, Lexington, KY (US);
Lexmark International, Inc., Lexington, KY (US);
Abstract
Compensation for beam separation of multiple laser beams of a laser printer simultaneously scanning a photoconductor drum is automatically made. The time for the lead beam to travel a predetermined distance is ascertained and then the separation time between the lead beam and one of the remaining beams is determined. When using only one light sensor, the time for the lead beam to travel the predetermined distance is the scan time of the lead beam. When using two light sensors, the time for the lead beam to travel the predetermined distance is the time for the lead beam to travel between the two light sensors, which define the predetermined distance, in the same scan. This determination of the time for the lead beam to travel the predetermined distance and its separation time from another of the remaining beams is continuously made for all of the remaining beams even during printing. If the beam separation time of each of the remaining beams from the lead beam is large enough for the one light sensor to generate distinct pulses for the lead beam and any one of the remaining beams during the same scan, the separation time for any one of the laser beams can be directly measured in only one scan.