The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 1999
Filed:
Nov. 05, 1997
Applicant:
Inventor:
Philip R Brierley, Madison, WI (US);
Assignee:
Pike Technologies of Wisconsin, Inc., Madison, WI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
25033911 ; 25033912 ; 2503418 ;
Abstract
An internal reflection element for a Fourier transform infrared spectrometer employs a single lens providing refraction and internal reflection of an infrared beam so as to focus the beam on a centrally located sample surface and to collect and focus radiation reflected from this sample surface for analysis.
Brierley, Philip. (1999). Imaging stage for fourier transform infrared spectrometer (U.S. Patent No. 5965889). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5965889
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile