The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 1999

Filed:

Oct. 14, 1997
Applicant:
Inventors:

Devertt DeWayne Woolwine, Neenah, WI (US);

Robert Griffiths Brandon, Appleton, WI (US);

Louis Maurice Chapdelaine, Appleton, WI (US);

Joseph Daniel Coenen, Neenah, WI (US);

Scott Lee Kastman, Greenville, WI (US);

Robert Lee Popp, Hortonville, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B / ;
U.S. Cl.
CPC ...
156 64 ; 53 51 ; 156229 ; 156324 ; 156361 ; 156495 ; 226 29 ; 226 30 ;
Abstract

A process and apparatus for controllably registering two continuously moving layers of material is provided. One of the layers is an elastic film and has a plurality of reference marks representing a plurality of separate and distinct components, and the other of the continuously moving layers has a respective plurality of different components thereon. The process and apparatus controls the distance between reference marks to a selected distance, and controllably registers each reference mark to a respective component of the continuously moving second layer.


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