The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 1999

Filed:

Jul. 01, 1998
Applicant:
Inventor:

Mineki Hayafuji, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600401 ; 600558 ; 600560 ;
Abstract

In the non-contact intraocular pressure measuring apparatus for measuring the intraocular pressure of the eye to be examined for a suitable measurement time, after alignment of the apparatus main body with the eye to be examined is performed, the time required for charging the condenser is calculated based on current supply time for the rotary solenoid at the time of the previous intraocular pressure measurement. When the calculated charging time elapses, the desired quantity of current is supplied from the condenser to the rotary solenoid, allowing the air supply unit to spray air to the cornea of the eye to be examined. The cornea is transfigured and flattened by the sprayed air. At the same time, intraocular pressure measuring light is illuminated from the intraocular pressure measuring optical system to the flattened cornea. The reflected light therefrom is detected to calculate intraocular pressure value of the eye to be examined.


Find Patent Forward Citations

Hayafuji, Mineki. (1999). Intraocular pressure measuring apparatus (U.S. Patent No. 5964704). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5964704

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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