The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 1999
Filed:
May. 13, 1998
Frederick J Barr, Houston, TX (US);
Josef Paffenholz, Missouri City, TX (US);
Western Atlas International, Inc., Houston, TX (US);
Abstract
A method for determining ocean bottom reflectivities from dual sensor seismic data, whereby a first time windowed pressure signal and a first windowed velocity signal are summed to generate a first summed signal, and a second time windowed pressure signal and a second time windowed velocity signal are summed to generate a second summed signal. The first summed signal and the second summed signal are transformed from the time domain to the frequency domain to generate a first transformed sum and a second transformed sum, respectively. A value R for said ocean bottom reflectivity is selected and used to calculate an inverse Backus filter (1+Rz).sup.2, where Z is the Z-transform of the two-way travel time delay filter. The first transformed sum and the second transformed sum are multiplied by the inverse Backus filter to generate a first filtered sum and a second filtered sum, respectively. A cross spectrum is calculated from the first filtered sum and the second filtered sum to generate a trial cross spectrum. An optimization algorithm is applied to the trial cross spectrum to determine the ocean bottom reflectivity.