The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1999

Filed:

Jun. 24, 1998
Applicant:
Inventor:

Steven J Boutelle, Rogers, MN (US);

Assignee:

Waters Instruments, Inc., Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356433 ; 356436 ; 356 39 ;
Abstract

The present invention provides methods and devices for measuring radiation absorption by a sample. The invention enables one to determine whether the sample scatters the radiation of interest and, if so, to factor out the effects of such scattering and ore accurately determine the true absorption of the sample. The invention may employ a selectively controllable occluder which is moved between three or more different positions to yield three or more different radiation measurements. These measurements can then be compared to one another to determine the nature of any radiation scattering and factor out its effects, enabling more accurate absorption determinations.


Find Patent Forward Citations

Boutelle, Steven. (1999). Means and method for measuring absorption of radiation-scattering samples (U.S. Patent No. 5963335). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5963335

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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