The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1999

Filed:

Sep. 20, 1996
Applicant:
Inventors:

Yuichi Umeda, Iwaki, JP;

Junichi Saito, Iwaki, JP;

Ichiro Morishita, Sendai, JP;

Masaru Nakayama, Natori, JP;

Arao Sato, Sendai, JP;

Kazuhiro Katagiri, Sendai, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G / ; H03K / ;
U.S. Cl.
CPC ...
345157 ; 375238 ;
Abstract

An apparatus is disclosed for inclination detection wherein infrared transmitted signal, signal groups S1, S2, S3, . . . including a leader code, a parity bit and bits for data transfer are sequentially transmitted with an interval time t3. At each bit of the signal group S1, '1' and '0' of a binary signal expressing the data are not inverted, at the signal group S2, '1'and '0' expressing the data are inverted, and inversion and non-inversion are repeated every signal group. At bits of each signal group, since a time length expresses '1' and '0', a total time length of each signal group is different from that of other signal group. By repeating sets of inverted and non-inverted signal groups, the time length of each set is averaged, and hence, data processing can be made more efficient.


Find Patent Forward Citations

Umeda, Yuichi. (1999). Apparatus for inclination detection and input apparatus using this (U.S. Patent No. 5963194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5963194

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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