The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 1999
Filed:
Mar. 21, 1997
Haluk Konuk, Mountain View, CA (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
A method of detecting open circuit defects within an integrated circuit. The invention includes locating a conductive plate proximate to a top surface of the integrated circuit. A voltage potential is coupled to the conductive plate. The voltage potential of the conductive plate couples to open circuit interconnections within the integrated circuit. Open circuit interconnections are identified by monitoring the quiescent current conducted by the integrated circuit while controlling the voltage on the conductive plate and controlling inputs to the integrated circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile