The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1999

Filed:

Sep. 30, 1997
Applicant:
Inventor:

Martin Harold Manley, Saratoga, CA (US);

Assignee:

VLSI Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257530 ; 257 50 ;
Abstract

Disclosed is an apparatus and method for manufacturing antifuse structures on topographically varying silicon substrates. The antifuse structures are intelligently formed over topographically lower silicon substrate regions such that subsequent via hole etching processes do not over-etch underlying antifuse structures. Also discloses an apparatus and method for designing dummy metallization and polysilicon features in close proximity to antifuse structures such that subsequently deposited dielectric materials are induced to form thicker dielectric layers over antifuse structures. Advantageously, subsequent via hole etching does not substantially remove antifuse structure materials with may cause detrimental ionic contamination or antifuse infant mortality. In this manner, standard via hole etching techniques may be implemented for all inter-layer via holes without concern the concern of over-etching sensitive underlying devices.


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