The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1999

Filed:

Apr. 26, 1996
Applicant:
Inventors:

Shuzi Hayase, Yokohama, JP;

Yoshihiko Nakano, Tokyo, JP;

Rikako Kani, Yokohama, JP;

Mao Ito, Yokohama, JP;

Satoshi Mikoshiba, Yokohama, JP;

Takeshi Okino, Yokohama, JP;

Sawako Fujioka, Tokyo, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08K / ;
U.S. Cl.
CPC ...
524588 ; 528 10 ; 528 31 ; 528 21 ; 524443 ; 524789 ; 427493 ; 427510 ; 427515 ; 427387 ; 430326 ; 430322 ; 430920 ; 522 63 ; 522172 ;
Abstract

A method of forming a pattern comprising the steps of forming a film of an organosilane compound comprising a polysilane having a repeating unit represented by the following general formula (1) on a substrate, irradiating an actinic radiation onto a predetermined portion of the film of the organosilane compound formed on the substrate, and removing the predetermined portion of the film irradiated by the actinic radiation by dissolving it with an aqueous alkaline developing solution. ##STR1## wherein Ar is a substituted or non-substituted aryl group.


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