The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 1999
Filed:
Dec. 17, 1997
Chung-Tao David Wang, Melville, NY (US);
Robert Howard Kagann, Cumming, GA (US);
AIL Systems, Inc., Deer Park, NY (US);
Abstract
An improved method for use with an open-path fast Fourier infrared spectrometer performs real-time, spectral alignment on measured interferograms to reduce measuremental errors. The improved method includes the step of selecting a plurality of water-vapor lines in a defined spectral region and comparing the centerline of these measured water vapor lines to a reference library. From these comparisons, the spectrometer calculates correction factors to apply to the spectrometer bandwidth. The improved spectrometer performs transform functions on selected segments of the spectrometer bandwidth which introduce integer-continuous corrective shifts on subsequently measured interferogram data.