The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 1999
Filed:
Jul. 25, 1997
James K Riley, Redmond, WA (US);
William E Ortyn, Devall, WA (US);
Yuhui Cheng, Redmond, WA (US);
Tuan H Phan, Lynwood, WA (US);
Wayne A Biggs, Kirkland, WA (US);
NeoPath, Inc., Redmond, WA (US);
Abstract
Improving accuracy of frequency response measurements of linear systems using modulation transfer function test compensation. An optical imaging system illuminates and images an input test pattern. A processor measures a modulation transfer function. The processor determines a compensating factor for error in the input test pattern duty cycle. The driving function for the measurement is a test pattern having a periodic waveform approximating a square wave with an error in duty cycle. A windowed fast fourier transform on a greyscale image of the test pattern generates odd harmonics. Adjusting amplitude values of the odd harmonics corrects for the error in resolution target duty cycle.