The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 1999
Filed:
Oct. 08, 1997
W Henry Weinberg, Woodside, CA (US);
Eric W McFarland, San Jose, CA (US);
Peijun Cong, Cupertino, CA (US);
Shenheng Guan, San Jose, CA (US);
Symyx Technologies, Santa Clara, CA (US);
Abstract
Methods and apparatus for screening diverse arrays of materials are provided. Techniques are provided for rapidly characterizing compounds in combinatorial arrays of materials for discovering and/or optimizing new materials with specific desired properties. A scanning mass spectrometer is used which includes an ionization chamber and a collector that outputs an electrical signal responsive to the quantity of gas ions contacting the collector surface. A conduit system selectively withdraws samples from the array of materials, passing the samples into the ionization chamber. In a specific embodiment, reactants are passed through the conduit system to the selected regions of interest on the substrate.