The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 1999
Filed:
Oct. 28, 1997
Tetsuji Kishi, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A test unit for testing a random logical circuit and a functional macrocircuit according to a scan test mode signal and a macro test mode signal is provided. The test unit includes a first and a second bidirectional I/O module. Whereas the first bidirectional I/O module is a module for providing a macro test output signal outside or providing a scan test input signal to the random logical circuit, and in addition, for performing input/output processing of a first normal input signal and a first normal output signal with respect to the random logical circuit, the second bidirectional I/O module is a module for providing a macro test input signal to the functional macrocircuit or providing a scan test output signal outside, and in addition, for performing input/output processing of a second normal input signal and a second normal output signal with respect to the random logical circuit.