The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 1999

Filed:

Jan. 13, 1997
Applicant:
Inventors:

Edward M Jacobs, Mountain View, CA (US);

Kent A Dickey, Sunnyvale, CA (US);

Kathleen C Nix, San Jose, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ; G06F / ;
U.S. Cl.
CPC ...
714 30 ; 711118 ; 714 42 ; 714703 ; 714718 ;
Abstract

A processor-to-memory interface (PMI) for a multiprocessor computer system and a computer testing method are disclosed. The multi-processor computer system provides a processor-to-memory-bus interface for each microprocessor. Each processor-to-memory-bus interface translates between microprocessor and bus protocols and manages respective level-2 (L2) caches. In addition, each interface includes test-event hardware that, when enabled causes test events to be generated with a predetermined repetition rate. The test events are selected for having a non-zero probability of causing system events that are complex, rare and non-fatal. These include assertions of 'busy' and 'wait' conditions and corrections of single-bit cache errors. The test-event hardware includes a timing generator that determines when test events are to be generated, an event-flag register that determines which events are to be generated, and a test-event generator that generates test-events at the times determined by the timing generator. The timing generator can include a down counter and a register for holding a value to be entered into the counter upon initialization and reset. So that cache error-correction logic can be tested, a cache manager includes a cache-error generator that can generate cache errors at times determined by said timing generator. The test-event hardware permits system events of interest to be repeatedly generated during a test procedure without repeated intervention by a test program. The hardware test-event generation simplifies test program design and allows faster testing throughput.


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