The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 1999
Filed:
Aug. 14, 1995
Applicant:
Inventors:
Gerard T Luk Pat, Stanford, CA (US);
Craig H Meyer, Mountain View, CA (US);
John M Pauly, San Francisco, CA (US);
Dwight G Nishimura, Palo Alto, CA (US);
Assignee:
Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600410 ; 600419 ; 324306 ; 324309 ;
Abstract
Flyback imaging is combined with echo planar imaging (EPI) for improved readout flow properties. For increases in imaging time of 50% or less, significant improvements in imaging are realized. The partial flyback improves partial-Fourier EPI and inside-out EPI and can be applied to any EPI trajectory.