The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 1999

Filed:

Mar. 04, 1997
Applicant:
Inventor:

Takahisa Shirakawa, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
707517 ;
Abstract

An article layout device which comprises an article data input section, a column shape data generation section to divide the article space into a plurality of columns, a column layout order generation section to provide the generated columns with the layout orders, an article layout order generation section to provide the article data with the layout orders, a layout source data synthesis section to newly synthesize the division result of the article space, the column layout order and the article data layout order, an allocation section to allocate the article data to the columns according to the column layout order and the article data layout order, a layout result evaluation section to evaluate the layout results by the allocation section, an optimum layout result retrieval section to detect the layout result according to the evaluation result by the layout result evaluation section and an article output section to lay out and output the article data on the article space according to the layout result detected by the optimum layout result retrieval section.


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