The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 1999

Filed:

Apr. 23, 1997
Applicant:
Inventor:

Toyohiko Tsunemine, Hyogo-ken, JP;

Assignee:

Sanyo Electric Co., Ltd., Moriguchi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348 93 ; 382101 ; 356237 ;
Abstract

A printing face inspecting apparatus comprising an illuminating device for illuminating a printing face of an object to be inspected and a plurality of image pickup devices for taking pictures of reflection light from the printing face. The image pickup devices consist of a color camera arranged in approximate a center of the devices, and a plurality of black and white cameras arranged on the outer periphery of the color camera. Both of hue defects and the concentration difference defects can be inspected, and all the defects on the printing face can be detected without fail. The deterioration through detection leakage of the defects can be reduced and the quality of the objects to be inspected can be improved.


Find Patent Forward Citations

Tsunemine, Toyohiko. (1999). Printing face inspecting apparatus (U.S. Patent No. 5956080). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5956080

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…