The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1999
Filed:
Mar. 28, 1997
Robert Snee Gilmore, Burnt Hills, NY (US);
Ronald Alan Kline, Norman, OK (US);
John Broddus Deaton, Jr, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and apparatus are provided for simultaneously measuring the anisotropic orientation and the thickness of an article. The apparatus comprises a transducer assembly which propagates longitudinal and transverse waves through the article and which receives reflections of the waves. A processor is provided to measure respective transit times of the longitudinal and shear waves propagated through the article and to calculate respective predicted transit times of the longitudinal and shear waves based on an estimated thickness, an estimated anisotropic orientation, and an elasticity of the article. The processor adjusts the estimated thickness and the estimated anisotropic orientation to reduce the difference between the measured transit times and the respective predicted transit times of the longitudinal and shear waves.