The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 21, 1999

Filed:

May. 26, 1998
Applicant:
Inventors:

Lee Chase, Los Gatos, CA (US);

John Goss, San Jose, CA (US);

Graham V Walford, Oakridge, TN (US);

Assignee:

Honeywell-Measurex Corporation, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D21F / ; D21F / ; D21F / ;
U.S. Cl.
CPC ...
162263 ; 162258 ; 162259 ; 162D / ; 162D / ; 36447102 ;
Abstract

An apparatus for sensing three properties of materials: the conductivity or resistance, the dielectric constant, and the proximity of the material to the sensor portion of the apparatus. The apparatus includes a fixed impedance element coupled in series with the sensor portion of the apparatus between an input signal and ground. The sensor portion of the apparatus is an electrode configuration which includes at least two electrodes with a portion of the material residing between and in close proximity to the electrodes. The sensor exhibits a variable impedance resulting from changes in physical characteristics of the material. The fixed impedance element and the variable impedance of the sensor portion form a voltage divider network such that changes in impedance of the sensor portion results in changes in voltage on the output of the apparatus. The variable impedance of the sensor portion relates to changes in property of the material being sensed which can then be related to changes in other physical characteristics of the material such as weight, chemical composition, and temperature.


Find Patent Forward Citations

Loading…