The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1999
Filed:
Apr. 08, 1997
Applicant:
Inventor:
Luigi Ternullo, Jr, San Jose, CA (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714718 ;
Abstract
A method and apparatus for testing circuitry, such as a memory or a logic circuit, having a plurality of outputs, includes a built-in self-testing (BIST) test state machine for generating a plurality of address outputs, a plurality of multiplexers controlled by the address outputs of the test state machine, and a testing device for testing the plurality of outputs of the circuitry based on the address outputs of the test state machine. The plurality of outputs of the circuitry are input to the plurality of multiplexers and a number of outputs tested simultaneously is less than a total number of outputs of the circuitry.