The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 21, 1999
Filed:
Dec. 30, 1996
John V McLain, Jr, Colorado Springs, CO (US);
Dale W Harris, Jr, Richardson, TX (US);
MCI Communications Corporation, Washington, DC (US);
Abstract
A computer testing system, method, and computer program product is provided for testing one or more digital cross connect devices (DXCs) with one or more test and monitoring units (TMUs). A DXC test tool is coupled to each DXC and to each TMU. The DXC test tool sends a logical command or query to a DXC. A TMU tests the physical presence of the logical command directed to the DXC. The TMU sends a response to the DXC test tool indicating the state of the physical component. In this way, the DXC test tool tests each DXC in physical and logical dimensions. The DXC test tool can communicate over a plurality of communication links including fast channel links, human readable links, and remote control links. Routers are used to expand capacity. A single message display option for selecting between sending ASCII messages and sending binary messages. By connecting the DXC test tool to multiple DXCs, end-to-end path testing in physical and logical dimensions is performed. The DXC test tool also generates an analysis log of unexpected DXC and TMU responses. The analysis log and communication log are comprised of records having data fields so that a user can filter the logs. Timestamps further aid analysis. A scripting language is used that significantly reduces the number of lines required for a script. The scripting language uses repeatable commands and pointers that point to data tables. Multiple DXCs can be tested in parallel by running multiple scripts at the same time. The user-interface allows for interactive and dynamic script execution.