The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
Jul. 01, 1997
Rolando Patricio Espindola, West Orange, NJ (US);
Ashish Madhukar Vengsarkar, Berkeley Heights, NJ (US);
Jefferson Lynn Wagener, Charlottesville, VA (US);
Lucent Technologies, Inc., Murray Hill, NJ (US);
Abstract
Embodiments of the invention include a method for fabricating Bragg reflector gratings using an amplitude mask and an amplitude mask apparatus for fabricating Bragg reflectors. The inventive Bragg reflector gratings have periodicities greater than conventional short period gratings but much less than conventional long period gratings. Short period, Bragg reflector gratings according to embodiments of the invention have periodicities, e.g., within the range from 1 .mu.m to 10 .mu.m. The fabrication method includes positioning an amplitude mask having appropriate slits formed therein over the photosensitive waveguide of interest and then illuminating the waveguide through the slits thereby photoinducing a periodic pattern of refractive index perturbations characteristic of a Bragg reflector. The short period, Bragg grating produced by the inventive amplitude mask is a reflective grating whose reflection characteristics approach approximately 99.99%. Reflective gratings fabricated in accordance with embodiments of the invention are useful in adding and dropping channels in wavelength division multiplexed systems and in applications such as laser stabilization and structural integrity sensing.