The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
Feb. 02, 1998
Masahiro Morikawa, Hino, JP;
Kazumi Furuta, Hino, JP;
Konica Corporation, Tokyo, JP;
Abstract
A defect inspecting apparatus for optically inspecting a defect of a subject to be inspected, includes: a first light guiding member having a first columnar light transmitting member including a first side surface and a second side surface facing the first side surface, curvature of the first side surface being smaller than that of the second side surface, and a first light scattering band having a definite width provided on the second side surface of the first columnar light transmitting member in a columnar axis direction. The first light guiding member enables a transmitted light or a reflected light of a light illuminated to the subject to be inspected from a light source to enter the first side surface, a part of the light incident on the first side surface to guide substantially to the columnar axis direction of the first light guiding member thereby to reach an end thereof, the other part of the light incident on the first side surface to emit from the second side surface. The defect inspecting apparatus further includes: a first light detecting means for detecting the light guided to the circular end of the first light guiding member; and a light detecting device for detecting the light emitted from the second side surface of the first light guiding member.