The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
Dec. 22, 1997
Jeffrey L Miller, Hermosa Beach, CA (US);
Alan Markus, Lake Forest, CA (US);
McDonnell Douglas Corporation, St. Louis, MO (US);
Abstract
Quality control for stitching of a textile article is performed by measuring thread tension in the stitches as the stitches are being made, determining locations of the stitches, and generating a map including the locations and stitching data derived from the measured thread tensions. The stitching data can be analyzed, off-line or in real time, to identify defective stitches. Defective stitches can then be repaired. Real time analysis of the thread tensions allows problems such as broken needle threads to be corrected immediately.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile