The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
May. 01, 1996
Hitoshi Fujimiya, Yokohama, JP;
Kenji Yamamoto, Yokohama, JP;
Toshiaki Ito, Yokohama, JP;
Hisanori Nasu, Yokohama, JP;
Hitachi Software Engineering Co., Ltd., Kanagawa-ken, JP;
Abstract
A scanning apparatus for scanning and reading a luminescent pattern of a sample in a flat-plate shape, having a placing member for placing the sample as an object for reading; a light condensing member for condensing light emitted from the luminescent pattern of the sample; a movement member for moving the light condensing member relative to the placing member; a light receiving member for dividing the light of the luminescent pattern of the sample condensed by the light condensing member into predetermined segments and receiving the light by scanning the light from the segments in a one-dimensional way; a photoelectrical conversion member for converting optical signals of the light received by the light receiving member into electrical signals; a control member for controlling a scan by the light receiving member in accordance with the electrical signals from the photoelectrical conversion member; and a data processing member for converting the electrical signals from the photoelectrical conversion member into digital signals and reconfiguring an image from the optical signals of the light from the segment received selectively in a one-dimensional way. The scanning apparatus can likewise scan and read a non-luminous or less luminous pattern of a sample by allowing light from a plane light source to transmit through the pattern of the sample.