The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1999

Filed:

Oct. 21, 1997
Applicant:
Inventors:

Jorg Melcher, Lehre, DE;

Rolf Lammering, Meine, DE;

Eric M Flint, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324318 ; 324318 ; 324319 ; 324320 ; 324322 ; 324307 ; 324300 ;
Abstract

The invention relates to a process for magnetic resonance examinations, in particular nuclear spin tomography, whereby a static magnetic field is produced in an examination zone and at least one gradient magnetic field is superposed, whereby unwanted alternating electromagnetic forces are produced, whereby by means of magnetostriction, forces opposing the electromagnetic forces are produced by the same gradient magnetic field and these forces act longitudinally and/or radially and/or around the circumference of the examination zone. Furthermore, the invention relates to a device for magnetic resonance examinations, in particular nuclear spin tomography, with a first generating unit for a static magnetic field, a second generating unit (20) for at least one gradient magnetic field and a support unit (10) for the second generating unit (20), whereby a magnetostrictive material system (11, 12) is provided on the support unit (10).


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