The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1999

Filed:

Apr. 07, 1997
Applicant:
Inventor:

David Feinberg, Schokan, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

An MRI method and system in which phase gradients and read gradients overlap over varying time durations. The MRI signals sampled while there is no overlap fill a non-rectangular matrix in K-space. Alternately, the MRI signal is sampled during the times of overlap as well but a zero is placed at the corners of the matrix at locations which correspond to overlap. The benefit include a reduction in the MRI data acquisition time for the same spatial resolution as known sequences, an increase in image spatial resolution for the same MRI data acquisition time as known sequences, lower signal bandwidth and increase the image signal-to-noise ratio (SNR). In addition, in a gradient echo MRI sequence, the read and write gradients do not overlap in time but vary in width (or at least one of the them varies in width) with time to achieve similar advantages.


Find Patent Forward Citations

Loading…