The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
Jun. 26, 1998
Seetharamaiah Mannava, Cincinnati, OH (US);
William D Cowie, Xenia, OH (US);
P Kennard Wright, III, Cincinnati, OH (US);
Robert D McClain, Cincinnati, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
A method for quality assurance of a laser process and more particularly a laser shock peening process that uses a test coupon having a deflection formed by a laser firing. The test coupon is from a metallic strip having opposite first and second sides that generally define a plane of the strip and the strip includes a laser shock peened patch of the strip that has first and second laser shock peened surfaces on the first and second sides, respectively, first and second laser shocked regions having deep compressive residual stresses imparted by the laser shock peening extending into the strip from the first and second laser shock peened surfaces, respectively, and a deflection of a portion of the strip from a position of the portion before the laser shock peening. The deflection is formed by the laser shock peening such that at least a part and preferably substantially all of the deflection lies in the plane of the strip and the test coupon preferably includes an indicating means to indicate the deflection. The quality assurance process of the present invention may further include correlating high cycle fatigue to the deflection.