The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
Sep. 18, 1997
Applicant:
Inventor:
Peter Dilwyn Evans, Wales, GB;
Assignee:
Critikon Company, L.L.C., Tampa, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600473 ; 600437 ; 73653 ; 356351 ;
Abstract
An apparatus and method of non-invasive measurement of a chosen region (4) within a body (2), using the transmission of an ultrasonic pulse and the measurement of back scattered optical radiation which has been modulated by the ultrasonic pulse at the region of interest. There may be two or more ultrasonic transmitters (10, 14) to allow control of the vibration of the ultrasonic pulses at the region (4) of interest.
Evans, Peter. (1999). Apparatus and method for non-invasive measurement of a substance (U.S. Patent No. 5951481). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5951481
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile