The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 1999
Filed:
Jul. 30, 1997
Koji Matsuoka, Kyoto, JP;
Kazushi Ohtsuka, Kyoto, JP;
Keiichi Fukada, Kyoto, JP;
Xu Kexin, Kyoto, JP;
Kyoto Daiichi Kagaku Co., Ltd, Kyoto, JP;
Kurashiki Boseki Kabushiki Kaisha, Kurashiki, JP;
Abstract
A light equipment irradiating a target with light adjusts light from a light source in a light source optical system and introduces the same into an acousto-optic device, for separating the same into its spectral components and modulating the same in the acousto-optic device. A condensing optical system condenses first order diffractive light outgoing from the acousto-optic device, so that an irradiation optical system irradiates a target with the same. A photodetection device comprises a photoreceiving part and a data processing part, so that the photoreceiving part converts a signal responsive to the fluctuation of modulated measuring light to a plurality of signals of different degrees of amplification simultaneously outputting same. The data processing part selects a non-saturated value of an amplifier or an A-D convertor while maintaining the largest degree of amplification from these signals, and lock-in processes same with a modulation frequency modulating the measuring light. A specific substance in a scattering substance can be non-invasively measured with high accuracy.