The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 1999
Filed:
Jul. 28, 1997
BASF Aktiengesellschaft, Ludwigshafen, DE;
Abstract
A method and an apparatus for determining diffusion parameters, concentration, size or flow behavior of particles in a sample, exciting light of a light source being directed into the sample, Raman scattered light being collected from an observed volume of the sample and being passed on to a spectrograph where it is resolved into spectral lines, the intensity of at least one spectral line being measured at least 10 times per second by means of one photodetector each, and the measured intensity values for the respective spectral line being used, via a fluctuation analysis, preferably an autocorrelation or a frequency analysis, to calculate diffusion parameters, concentration, size or flow behavior of the particle to which the spectral line in question can be assigned. With this method, it is also possible for signals of different spectral lines or bands, or signals of Raman scattered light, quasi-elastically scattered light and fluorescence light to be correlated with one another.