The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1999

Filed:

Sep. 03, 1998
Applicant:
Inventors:

Hartmut Ehbets, Platz, CH;

Heinz Bernhard, Grub, CH;

Kurt Giger, Ruethi, CH;

Juerg Hinderling, Heerbrugg, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C / ;
U.S. Cl.
CPC ...
356-501 ; 356-51 ;
Abstract

A device for measuring distance with a visible measuring beam (11) generated by a semiconductor laser (10), has a collimator object lens (12) to collimate the measuring beam towards the optical axis (13) of the collimator object lens (12), an arrangement to modulate the measuring radiation, a reception object lens (15) to receive and image the measuring beam reflected from a distant object (16) on a receiver, a switchable beam deflection device (28) to generate an internal reference path between the semiconductor laser (10) and the receiver and an electronic evaluation device (25) to find and display the distance measured from the object. According to the invention, the receiver contains a light guide (17') with a downstream opto-electronic transducer (24), in which the light guide inlet surface (17) is arranged in the imaging plane of the reception object lens (15) for long distances from the object and can be controllably moved (18') from this position (18) transversely to the optical axis (14). In an alternative embodiment, the light inlet surface (17) is fixed and there are optical means (36) outside the optical axis (14) of the reception object lens (15) which, for short object distances, deflect the imaging position of the measuring beam to the optical axis (14) of the reception object lens (15). The measuring radiation is pulse modulated with excitation pulses with a pulse width of less than two nanoseconds.


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