The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1999

Filed:

Apr. 04, 1996
Applicant:
Inventors:

Ryuichi Kobayashi, Fuchu, JP;

Mitsuo Hattori, Tokyo, JP;

Tsuyoshi Ideguchi, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 725 ; 324544 ;
Abstract

A non-contact voltage probe is used to measure the voltage of electromagnetic interference developed in a cable or the like electrically connected to pieces of electronic equipment. The non-contact voltage probe has double coaxial cylindrical-type inner and outer electrodes through which a cable or the like is passed. The inner electrode is electrically connected to a voltage detector, which measures the voltage induced by the capacitance between the inner electrode and the cable passing there through, and the outer electrode is grounded.


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