The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1999

Filed:

Jan. 28, 1994
Applicant:
Inventors:

Robert R Alfano, Bronx, NY (US);

Kwong Mow Yoo, New York, NY (US);

Samir Ahmed, New York, NY (US);

Zhi-Wei Zang, New York, NY (US);

Feng Liu, Bronx, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2504591 ; 2504581 ; 2504611 ; 2504612 ;
Abstract

A technique for forming an image of an object in or behind a scattering medium. In one embodiment, the object is made luminescent, and the luminescent light is selected for imaging while the illuminating light is filtered out. The quality of the image can be further improved by selected the portion of the luminescence spectrum that is strongly absorbed by the scattering medium.


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Alfano, Robert. (1999). Technique for imaging an object in or behind a scattering medium (U.S. Patent No. 5949077). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5949077

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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