The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 07, 1999
Filed:
Dec. 03, 1998
Ralph M Somers, Cincinnati, OH (US);
Marek L Winiarz, Cincinnati, OH (US);
James D Risbeck, Cincinnati, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
A method for quality assurance of a laser shock peening process that quantitatively analyzes a single laser shock peened dimple or spot. The method measures a first interior surface of the first dimple to obtain height data and the processes the height data to obtain production volumetric data of the dimple. The volumetric data may then be compared to a predetermined correlation of test volumetric data and high cycle fatigue failure based on high cycle fatigue tests of test pieces that were laser shock peened in the same or similar laser shock peening apparatus as the production workpieces. The test pieces may each have a failure precipitating flaw within a laser shock peened area of the test piece that was laser shock peened in the same or similar laser shock peening apparatus. Preferably, the measuring is performed using a profilometer such as an interferometric optical profilometer.