The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 1999
Filed:
Jan. 26, 1998
Vilnis E Kubulins, Walton Hills, OH (US);
Innovative Sensor Solutions, Ltd., Houston, TX (US);
Abstract
An optical sensor for determining an index of refraction of a substance being monitored includes a light source (20). An optical element (24) having a coupling surface (30) and a measuring surface (26) is arranged such that light directed into the optical element (24) through the coupling surface (30) is partially reflected twice from the measuring surface such that it is directed to and exits through the coupling surface (30). The measuring surface (26) is preferably spherical. An input optical fiber (22) having first and second ends directs light emitted from the light source to the coupling surface of the optical element. The first and second ends of the input optical fiber (22) are optically coupled to the coupling surface (30) of the optical element (24) and the light source, respectively. An output optical fiber (28) has first and second ends and directs light expelled from the coupling surface (30) of the optical element (24) to a photodetector (50). The first and second ends of the output optical fiber (28) are optically coupled to the coupling surface (30) of the optical element (24) and the photodetector, respectively. The amount of light that is partially reflected at each reflection from the measuring surface (26) is dependent upon the difference between the index of refraction of the optical element (24) and the index of refraction of the substance being monitored (12) which is adjacent the measuring surface (26) of the optical element.