The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 1999

Filed:

Mar. 05, 1997
Applicant:
Inventors:

Paul R McDonough, Marlboro, NJ (US);

Dennis A Oleary, Red Bank, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324754 ; 3241581 ;
Abstract

A radio frequency (RF) test probe arrangement includes a test probe body with a probe for coupling with a RF port of a circuit to be tested, wherein the port has a RF terminal and a ground conductor in the vicinity of the RF terminal to define an operating impedance at the RF port. The probe includes an RF contact supported by the probe body for electrically contacting the RF terminal of the RF port of the circuit to be tested, and a ground contact fixed on the probe body in the vicinity of the RF contact, for electrically contacting the ground conductor at the RF port. A connector mounted on the probe body couples the probe with external test measurement instrumentation.


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