The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 1999
Filed:
Aug. 22, 1997
Yujin Arai, Akiruno, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A laser scan microscope irradiates a sample with a laser beam while simultaneously scanning the laser beam over the sample, and processes an optical signal obtained thereby so as to obtain image data. The laser scan microscope is provided with a photoelectric converting unit, a sensitivity adjuster, and a sampling/converting unit. The photoelectric converting unit converts an optical signal from the sample into an electric signal. The sensitivity adjuster adjusts the sensitivity of the photoelectric converter such that an output value of the photoelectric converting unit becomes closer to a predetermined reference value. The sampling/converting unit samples sensitivity information determined for the photoelectric converter, in accordance with a scanning speed, and converts the sampled sensitivity information into a light measurement value used for obtaining the image data.