The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 1999

Filed:

Jan. 15, 1998
Applicant:
Inventors:

David A Bossen, Palo Alto, CA (US);

E Michael Heaven, North Vancouver, CA;

John D Goss, San Jose, CA (US);

Assignee:

Honeywell-Measurex Corporation, Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
D21F / ; D21F / ; D21F / ;
U.S. Cl.
CPC ...
162198 ; 162252 ; 162253 ; 162258 ; 162259 ; 162D / ; 162D / ;
Abstract

Apparatus and process for controlling the basis weight of paper produced in a papermaking machine are provided. In the papermaking process, a major portion of the paper stock flows through a first line that is controlled by a thick stock valve and a minor portion of the stock flow from the stuff box to the headbox is diverted through a second line that is regulated by a second valve (e.g., vernier valve). The thick stock valve is controlled by the dry end basis weight and the second valve responsive to measurements of the basis weight of the wet stock at the wire. The second line and control valve along with the wet end basis weight measurements form a fine control loop with fast response time whereas the first line and control valve that is responsive to dry end basis weight measurements form a course control loop. The dual control loops enable fast and actual basis weight control.


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