The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 1999
Filed:
Jul. 29, 1997
Masaru Sanada, Tokyo, JP;
Tokyo, Japan, Tokyo, JP;
Abstract
A failure point identifying method applicable to various defects and capable of promptly identifying a defect point. An LSI tester 4 sequentially impresses test vectors stored in a test vector file 1 across input terminals of a loaded LSI 5 to measure an Iddq value. A test vector number of a test vector which produced an abnormal Iddq value is delivered to a faulty block extractor 2. The faulty block extractor 2 performs logic simulation to find the input logic of each block of the LSI 5 when each test vector stored in the test vector file 1 is entered to the input terminals of the LSI 5. Moreover, a dump list associating each test vector number with the input logic is prepared from block to block. The faulty block is then identified based on the dump list of each block and the test vector number deliver from the LSI tester.