The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 1999
Filed:
Jun. 21, 1996
Fujitsu Ltd., Kawasaki, JP;
Abstract
An interference checking method for checking the interference between two objects in the shape of non-convex polyhedrons, comprising the steps of producing a convex hull for each of the non-convex polyhedrons, and checking the interference of the convex hull of one object with the convex hull of the other object; covering each of polygons which constitute each of the non-convex polyhedrons with a plurality of leaf spheres which have a predetermined radius and which are arranged on each polygon when the distance between the convex hulls becomes not more than a preset value, and sequentially enveloping the leaf spheres with hierarchical spheres so as to produce a binary tree of hierarchical envelope spheres; obtaining a pair of nearby spheres closest by checking the interference between envelope spheres of an upper grade on the basis of the structure of the binary tree, disassembling the interfering envelope spheres into envelope spheres of a lower grade, checking the interference between the envelope spheres of the lower grade, and repeating the interference check process and the disassembly process until no interference is detected; obtaining a nearby polygon pair which corresponds to the pair of nearby spheres; and checking the interference between the nearby polygon pair.