The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 1999
Filed:
Oct. 24, 1997
Patrick E Crane, Tampa, FL (US);
E Calvin Johnson, Tampa, FL (US);
Other;
Abstract
Special mathematical techniques are used to process accurate energy measurements in the focal plane of a high quality imaging system to produce high resolution images. The improved resolution exceeds the generally accepted Rayleigh limits. That is accomplished by adapting Fourier transform techniques and using both in-phase and quadrature or amplitude and phase components to recover the target scene. The measurement of the in-phase and quadrature or amplitude and phase components are taken in the focal plane and undergo parallel processing to preserve both amplitude and phase in the resulting image. A Fourier transform of the aperture characteristics is removed from a Fourier transform of the energy components to result in a Fourier transform of the image. The scene is recovered by taking an inverse Fourier transform of the result.