The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 1999

Filed:

Oct. 07, 1997
Applicant:
Inventors:

Douglas H Smith, Centerville, DE (US);

John Shigeura, Fremont, CA (US);

Timothy M Woudenberg, Half Moon Bay, CA (US);

Assignee:

The Perkin-Elmer Corporation, Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M / ;
U.S. Cl.
CPC ...
4353031 ; 4352851 ; 4352872 ; 4352884 ; 236-2 ; 165 61 ; 935 77 ; 935 88 ;
Abstract

Apparatus are disclosed that thermally cycles samples between at least two temperatures. These apparatus operate by impinging fluid jets onto the outer walls of a sample containing region. Because the impinging fluid jets provide a high heat transfer coefficient between the jet and the sample containing region, the sample containing regions are uniformly cycled between the two temperatures. The heat exchange rate between the jets and the sample regions are substantially uniform.


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