The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 1999

Filed:

Apr. 30, 1998
Applicant:
Inventors:

Gregory H Butcher, Lima, OH (US);

Neil Zumberger, Sidney, OH (US);

Shu An, Sidney, OH (US);

Assignee:

Aluminum Company of America, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B21D / ;
U.S. Cl.
CPC ...
723427 ; 72348 ; 413 17 ;
Abstract

A die tool monitor and analysis system identifies tooling changes and maintains tooling in an optimal position, thus maintaining the quality of the manufactured product within a desired tolerance band. A die tool force monitor and analysis system identifies changes in the operational conditions within a press. These identified changes are indicative of tooling changes and in conjunction with a thermal control system, facilitate the thermally induced expansion and contraction of a tooling support structure. The expansion and contraction of the supporting structure displaces the tooling member relative to its counterpart tooling member.


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