The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 1999
Filed:
Oct. 31, 1996
Yea-Shuan Huang, Hsinchu, TW;
Abstract
A design for a high reliability recognition system utilizes two optimized thresholds for each class k of a prototype data base. One threshold is a class region threshold CR.sub.k and the other is a dis-ambiguity threshold DA.sub.k. CR.sub.k specifies a constrained region belonging to a class k, and DA.sub.k corresponds to a value with which a sample belonging to class k can be correctly recognized with a high level of confidence. During recognition, if the distance D(x, r.sub.M) between an input sample x and the representative prototype r.sub.M of a nearest class M is larger than the class region threshold CR.sub.M, x will be rejected. Furthermore, if the distance D(x, r.sub.M) is subtracted from the distance D(x, r.sub.S) between x and the representative prototype r.sub.S of a second nearest class S, the resulting distance difference must be greater than the dis-ambiguity threshold DA.sub.M, or x will be rejected. An inventive algorithm is used to compute optimum thresholds CR.sub.k and DA.sub.k for each class k. The algorithm is based on minimizing a cost function of a recognition error analysis. Experiments were performed to verify the feasibility and effectiveness of the inventive method.